Science enabled by the high-brightness Electron Beams | Special seminar!

Xijie Wang | SLAC
Seminar room 3, 14:00

Electron sources represent an enabling technology for all cutting-edge applications of electron accelerators, two of the most notable ones being the X-ray free electron laser (FEL) and the electron microscope. FELs were enabled by the development of high-brightness electron sources, and they have changed the paradigm for a broad spectrum of scientific research. Electron microscopes have achieved sub-Å spatial resolution through the introduction of a cold field-emitter and aberration correction optics. Development of ultrashort high-brightness electron beam made it feasible to explore relativistic electrons for Ultrafast Electron diffraction (MeV-UED) [1]. Recent development in MeV-UED [2-3] has enabled broad scientific opportunities in ultrafast material science and chemical dynamics, such as revealing the energy flow in superconductor [4] and atomic movie of light-induced structural distortion in the perovskites solar cell [5]. Single-shot MeV-UED was successfully employed for the first observation of heterogeneous melting [6]. In the gas phase UED, we have successfully made transition from proof-of-principle experiments to investigating the unknown dynamics in chemical interesting systems, such as making a real space movie of a nuclear wavepacket passing through conical intersections [7].

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Science enabled by the high-brightness Electron Beams

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2. P Zhu et al, New Journal of Physics 17 (6), 063004 (2014).
3. S. Weathersby et al, Rev. Sci. Instrum. 2015, 86, 073702−073707.
4. Tatiana Konstantinova et al, Sci. Adv. 2018;4:eaap7427, doi: 10.1126/sciadv.aap7427.
5. Xiaoxi Wu et al, Sci. Adv. 3 e1602388 (2017) doi: 10.1126/sciadv.1602388.
6. M. Z. Mo et al, Science 360 1451–1455 (2018) doi: 10.1126/science.aar2058
7. J. Yang et al, Science, 361, 64-67. (2018) doi: 10.1126/science.aat0049.